Researcher Name: Keith A. Bowman
Title: Senior Research Scientist
Location: JF2
Lab: Circuit Research Lab (CRL)
Primary Research Area: Circuit Variability

Bio:
Keith A. Bowman received a B.S. degree from North Carolina State University in 1994, and M.S. and Ph.D. degrees from the Georgia Institute of Technology in 1995 and 2001, respectively, all in electrical engineering. From 2001 to 2004, he worked in the Technology Computer-Aided Design (TCAD) Group at Intel Corporation, where he developed and supported statistical-based models, methodologies, and software tools to predict microprocessor performance and power variability. Since 2004, he has worked in the Circuit Research Laboratories (CRL) at Intel, where his current research focuses on the development of circuit design solutions to mitigate the impact of parameter variations on circuit performance and power.